About this Hardcover
- ISBN-13
- 9781493966745
- Author
- Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,J...
- Publisher
- Springer New York
- Edition
- 4th ed. 2018
- Published
- 2017-11-18
- Pages
- 550
- Binding
- Hardcover
Verified US edition — ISBN 9781493966745
ISBN 9781493966745 identifies the 4th ed. 2018 of Scanning Electron Microscopy and X-Ray Microanalysis by Joseph I. Goldstein by Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nic..., published by Springer New York (2017-11-18). Every copy Book Shop Now ships against this ISBN is the genuine US-edition print run from the original publisher's authorized US distribution — no overseas reprints, no scanned facsimiles, no "international edition" rebranding. Verify this ISBN against your professor's syllabus before checkout.
About Springer New York
Springer Publishing Company (NYC) publishes nursing, counseling, social work, and health-professions reference books — including the 101/301 Careers series, Springer Series on Behavioral Addictions, and clinical advanced-practice references. Distinct from Springer Nature (scientific journals), Springer Publishing's titles dominate MSN/DNP and CACREP-accredited counseling program reading lists. We source directly from Springer's US warehouse.
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